Whether it is determining the origin of pollutants, characterizing contaminants in food, imaging individual biological cells or putting a date to historical objects, scientists use ion beams to help ...

Utilizing Secondary Ion Mass Spectrometry (SIMS) for in-line metrology is a newly emerging method of process control that requires contamination-free measurements, enabling SIMS on product wafers.

In recent decades, the preparation of samples for transmission electron microscopes has transformed, thanks to the introduction of focused ion beam (FIB) instruments. Known as either single-beam or ...

CLEVELAND — A small robotic surveyor arrives to explore a near-Earth asteroid. Another robotic spacecraft is returning to Earth with a pristine comet surface sample. Meanwhile, a robotic explorer is ...

It has been over 30 years since the first focused ion beam was used to make a TEM specimen. FEI, a company that is now part of Thermo Fisher Scientific, has been an essential part of helping take ion ...