(Image: A. Carlson, Wikimedia Commons, in the public domain) Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS) are both essential for analyzing material surfaces, offering ...

The Perkin Elmer PHI-660 scanning Auger microprobe can be used for the compositional analysis of specimen surfaces using Auger electron spectroscopy (AES). The probe depth of AES is on the order of ...

EE-ALD chambers in the group are equipped with a variety fo tools for in situ analysis including Auger electron spectroscopy, quadrupole mass spectrometry, spectroscopic ellipsometry, and retarding ...

The PHI 5800 X-ray photoelectron spectrometer (XPS) is equipped with a dual source anode (Al and Mg), a hemispherical analyzer for XPS and Auger electron spectroscopy (AES) analysis, including ...

Ultrahigh vacuum and surface preparation techniques. Principles of surface analytical techniques, including Auger electron spectroscopy, photoemission, low energy electron diffraction, energy loss ...

Recent research has focused on improving the accuracy and reliability of depth profiling methods, such as Auger Electron Spectroscopy (AES), Secondary Ion Mass Spectroscopy (SIMS), and Glow ...